This item still needs to be validated !
Title: Determination of the oxygen content in platelike and octahedral oxygen precipitates in silicon with FT-IR spectroscopy
Authors: De Gryse, O ×
Clauws, P
Vanhellemont, Jan
Claeys, Cor #
Issue Date: 1997
Host Document: pages:405-10
Conference: Defects in Semiconductors - ICDS-19; 21-26 July 1997; Aveiro, Portugal.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.