Title: Grounded-gate nMOS transistor behaviour under CDM ESD stress conditions
Authors: Verhaege, K ×
Russ, Christian
Luchies, J. M
Groeseneken, Guido
Kuper, F. G #
Issue Date: 1997
Series Title: IEEE Transactions on Electron Devices vol:44 pages:1972-1980
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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