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Title: A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs
Authors: Vasina, Petr ×
Simoen, Eddy
Claeys, Cor
Sikula, J #
Issue Date: 1998
Series Title: Microelectronics Reliability vol:38 issue:1 pages:23-27
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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