Title: Performance improvement of tall triple gate devices with strained SiN layers
Authors: Collaert, Nadine ×
De Keersgieter, An
Kottantharayil, Anil
Rooyackers, Rita
Eneman, Geert
Goodwin, Michael
Eyckens, Brenda
Sleeckx, Erik
de Marneffe, Jean-Francois
De Meyer, Christina
Absil, Philippe
Jurczak, Malgorzata
Biesemans, Serge #
Issue Date: Nov-2005
Series Title: IEEE Electron Device Letters vol:26 issue:11 pages:820-822
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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