ITEM METADATA RECORD
Title: Transient voltage overshoot in TLP testing - real or artifact
Authors: Tremouilles, David ×
Thijs, Steven
Mahadeva Iyer, Natarajan
Vassilev, Vesselin
Roussel, Philippe
Groeseneken, Guido #
Issue Date: 2005
Host Document: pages:152-160
Conference: Proceedings 27nd EOS/ESD Symposium location:Leuven Belgium date:11/09/05
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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