|ITEM METADATA RECORD
|Title: ||Transient voltage overshoot in TLP testing - real or artifact|
|Authors: ||Tremouilles, David|
Mahadeva Iyer, Natarajan
|Issue Date: ||2005 |
|Host Document: ||Proceedings 27nd EOS/ESD Symposium pages:152-160|
|Conference: ||27nd EOS/ESD Symposium location:Leuven Belgium date:11/09/05|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
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