Title: Transient voltage overshoot in TLP testing - real or artifact
Authors: Tremouilles, David
Thijs, Steven
Mahadeva Iyer, Natarajan
Vassilev, Vesselin
Roussel, Philippe
Groeseneken, Guido
Issue Date: 2005
Host Document: Proceedings 27nd EOS/ESD Symposium pages:152-160
Conference: 27nd EOS/ESD Symposium location:Leuven Belgium date:11/09/05
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.