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Title: A unified approach for hot-carrier degradation of DC current gain and 1/f noise of bipolar transistors
Authors: Decoutere, Stefaan ×
Simoen, Eddy
Vancuyck, Geert
Deferm, Ludo
Claeys, Cor #
Issue Date: 1997
Host Document: pages:104-107
Conference: Proceedings of the 1997 Bipolar/BiCMOS Circuits and Technology Meeting; location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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