Title: The effect of externally imposed mechanical stress on the hot-carrier-induced degradation of deep-sub micron nMOSFET's
Authors: Degraeve, Robin ×
Groeseneken, Guido
De Wolf, Ingrid
Maes, Herman #
Issue Date: 1997
Series Title: IEEE Transactions on Electron Devices vol:44 pages:943-950
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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