Title: Impact of elevated source drain architecture on ESD protection devices for a 90 nm CMOS technology node
Authors: Thijs, Steven ×
De Heyn, Vincent
Vassilev, Vesselin
Mahadeva Iyer, Natarajan
Linten, Dimitri
Jeamsaksiri, Wutthinan
Daenen, T
Jurczak, Malgorzata
Rooyackers, Rita
Groeseneken, Guido #
Issue Date: Sep-2003
Host Document: pages:242-249
Conference: EOS/ESD Symposium location:Leuven Belgium date:21/09/03
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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