Title: A comparative study of the oxide breakdown in short-channel nMOSFETs and pMOSFETs stressed in inversion and in accumulation regimes
Authors: Crupi, F ×
Kaczer, Ben
Degraeve, Robin
De Keersgieter, An
Groeseneken, Guido #
Issue Date: 2003
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:3 issue:1 pages:8-13
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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