Title: Charge trapping in SiO2/HfO2 gate dielctrics: comparison between charge-pumping and pulsed I-D-V-G
Authors: Kerber, A ×
Cartier, E
Pantisano, Luigi
Degraeve, Robin
Groeseneken, Guido
Maes, Herman
Schwalke, U #
Issue Date: 2004
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:72 issue:1-4 pages:267-272
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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