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Title: Degradation of MOSFETs on SIMOX by irradiation
Authors: Hakata, T
Ohyama, Hidenori
Simoen, Eddy
Claeys, Cor
Vanhellemont, Jan
Takami, Y
Sunaga, H
Ogita, Y
Issue Date: 1997
Conference: APSORC '97; October 6-9 , 1997; Kunamoto, Japan.
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems

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