Title: Sub-5-nm-spatial resolution in scanning spreading resistance microscopy using full-diamond tips
Authors: Alvarez, D ×
Hartwich, J
Fouchier, Marc
Eyben, Pierre
Vandervorst, Wilfried #
Issue Date: 2003
Series Title: Applied Physics Letters vol:82 issue:11 pages:1724-1726
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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