Title: Effects of detrapping on electron traps generated in gate oxides
Authors: Zhang, W.D ×
Zhang, J.F
Lalor, M.J
Burton, D.R
Groeseneken, Guido
Degraeve, Robin #
Issue Date: 2003
Publisher: IOP Pub.
Series Title: Semiconductor Science and Technology vol:18 issue:2 pages:174-182
ISSN: 0268-1242
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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