Title: A compact model for the grounded-gate nMOS transistor behaviour under CDM ESD stress
Authors: Russ, Christian ×
Verhaege, K
Bock, Karlheinz
Roussel, Philippe
Groeseneken, Guido
Maes, Herman #
Issue Date: 1998
Publisher: Elsevier Scientific Pub. Co.
Series Title: Journal of electrostatics vol:42 issue:4 pages:351-381
ISSN: 0304-3886
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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