Title: A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown
Authors: Degraeve, Robin ×
Ogier, Jean-Luc
Bellens, Rudi
Roussel, Philippe
Groeseneken, Guido
Maes, Herman #
Issue Date: 1998
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE transactions on electron devices vol:45 issue:2 pages:472-481
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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