Title: DESTIN: A new approach to interconnect reliability testing
Authors: Witvrouw, Ann
Beyer, Gerald
Maex, Karen
Tielemans, Luc #
Issue Date: 1998
Series Title: Semiconductor Fabtech vol:7 pages:343-347
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
# (joint) last author

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