Title: Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers
Authors: Pinardi, Kuntjoro ×
Jain, Uma
Jain, Suresh
Maes, Herman
Van Overstraeten, Roger
Willander, M #
Issue Date: 1998
Publisher: American Institute of Physics
Series Title: Journal of Applied Physics vol:83 issue:9 pages:4724-4733
ISSN: 0021-8979
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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