Title: Constant current charge-to-breakdown: still a valid tool to study the reliability of MOS structures
Authors: Nigam, Tanya ×
Degraeve, Robin
Groeseneken, Guido
Heyns, Marc
Maes, Herman #
Issue Date: 1998
Host Document: pages:62-9
Conference: Proceedings International Reliability Physics Symposium 1998; March 30 - April 2, 1998; Reno, Nevada, USA.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science