|ITEM METADATA RECORD
|Title: ||Investigation of correlations between parameters defining the state of sputtered particles|
|Authors: ||Vlekken, J ×|
De Schepper, Luc #
|Issue Date: ||1998 |
|Host Document: ||pages:931-934|
|Conference: ||SIMS XI - Secondary Ion Mass Spectrometry; 8-12 September 1997; Orlando, CA, USA.|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
× corresponding author|
# (joint) last author|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.