Title: New insights in the relation between electron trap generation and the statistical properties of oxide breakdown
Authors: Degraeve, Robin ×
Groeseneken, Guido
Bellens, Rudi
Ogier, Jean-Luc
Depas, Michel
Roussel, Philippe
Maes, Herman #
Issue Date: 1998
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE transactions on electron devices vol:45 issue:4 pages:904-11
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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