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Title: Correlation between radiation induced defects and lifetime degradation in high energy particle exposed float-zone silicon diodes
Authors: Simoen, Eddy
Claeys, Cor
Gaubas, Eugenijus
Ohyama, Hidenori
Issue Date: 1998
Conference: Belgische Natuurkundige Vereniging / Société Belge de Physique: General Scientific Meeting; May 19-20, 1998; Namur, Belgium. location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems

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