Title: Impact of CMOS Scaling and Technology Options on ESD Reliability
Authors: Mahadeva Iyer, Natarajan
Thijs, Steven
Vassilev, Vesselin
Tremouilles, David
Linten, Dimitri
Groeseneken, Guido
Issue Date: 2005
Conference: MRS International Conference on Advanced Materials (IUMRS-ICAM) location:Leuven Belgium date:04/07/05
Publication status: published
KU Leuven publication type: DI
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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