|ITEM METADATA RECORD
|Title: ||Impact of CMOS Scaling and Technology Options on ESD Reliability|
|Authors: ||Mahadeva Iyer, Natarajan|
|Issue Date: ||2005 |
|Conference: ||MRS International Conference on Advanced Materials (IUMRS-ICAM) location:Leuven Belgium date:04/07/05|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.