Title: Exploring the limits of stress-enhanced hole mobility
Authors: Smith, Lee ×
Moroz, Victor
Eneman, Geert
Verheyen, Peter
Nouri, Faran
Washington, Lori
Jurczak, Malgorzata
Penzin, Oleg
Pramanik, Dipu
De Meyer, Christina #
Issue Date: Sep-2005
Series Title: IEEE Electron Device Letters vol:26 issue:9 pages:652-654
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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