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Title: A novel methodology for sensing the breakdown location and its application to the reliability study of ultra-thin Hf-silicate gate dielectrics
Authors: Crupi, Felice ×
Kauerauf, Thomas
Degraeve, Robin
Pantisano, Luigi
Groeseneken, Guido #
Issue Date: Aug-2005
Series Title: IEEE Transactions on Electron Devices vol:52 issue:8 pages:1759-1765
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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