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Title: Temperature dependent current and charge trapping in thick SiO2/ZrO2 stacks
Authors: Blomme, Pieter ×
Govoreanu, Bogdan
Van Houdt, Jan
De Meyer, Christina #
Issue Date: 2003
Publisher: IEEE
Host Document: pages:592-593
Conference: 41st Annual Reliability Physics Symposium Proceedings location:Leuven Belgium date:30/03/03
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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