Title: Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors
Authors: Moens, P ×
Van den Bosch, Geert
Groeseneken, Guido #
Issue Date: 2003
Publisher: IEEE
Host Document: pages:214-221
Conference: Proceedings 41st Annual IEEE International Reliability Physics Symposium date:30/03/03
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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