Title: Recent trends in reliability assessment of advanced CMOS technologies
Authors: Groeseneken, Guido ×
Degraeve, Robin
Kaczer, Ben
Roussel, Philippe #
Issue Date: Apr-2005
Publisher: IEEE
Host Document: pages:81-88
Conference: IEEE Proceedings of the International Conference on Microelectronic Test Structures location:Leuven Belgium date:04/04/05
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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