ITEM METADATA RECORD
Title: Linearity of TXRF: droplet residues versus spin-coated wafers
Authors: Hellin, David ×
Fyen, Wim
Rip, Jens
Delande, Tinne
De Gendt, Stefan
Vinckier, Christiaan #
Issue Date: 2005
Host Document: 11th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods - TXRF
Conference: 11th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods - TXRF location:Budapest date:18-22 September 2005
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Molecular Design and Synthesis
× corresponding author
# (joint) last author

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