Title: Hot carrier degradation on n-channel SiO2/HfSiO MOSFETs: Effects on the devices performance and lifetime
Authors: Cimino, Salvatore ×
Pantisano, Luigi
Aoulaiche, Marc
Degraeve, Robin
Kwak, Dong Hwa
Crupi, Felice
Groeseneken, Guido
Paccagnella, A #
Issue Date: 2005
Publisher: IEEE
Host Document: pages:275-279
Conference: 43rd Annual IEEE International Reliability Physics Symposium Proceedings location:Padova I date:17/04/05
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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