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Title: Reliability issues in high-k based devices
Authors: Houssa, Michel ×
Degraeve, Robin
Kauerauf, Thomas
Aoulaiche, Marc
Groeseneken, Guido
De Gendt, Stefan
Heyns, Marc #
Issue Date: 2005
Publisher: Electrochemical Society
Host Document: pages:32-41
Conference: 4th International Conference on Semiconductor Technology - ISTC location:Leuven Belgium date:15/03/05
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
Molecular Design and Synthesis
× corresponding author
# (joint) last author

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