Title: Athermal germanium migration in strained silicon layers during junction formation with solid-phase epitaxial regrowth
Authors: Vandervorst, Wilfried ×
Janssens, Tom
Brijs, Bert
Delhougne, Romain
Loo, Roger
Caymax, Matty
Pawlak, Bartek
Posselt, Matthias #
Issue Date: Feb-2005
Series Title: Applied Physics Letters vol:86 issue:8 pages:81915
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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