Title: The low-frequency noise of strained Silicon n-MOSFETs
Authors: Simoen, Eddy ×
Eneman, Geert
Verheyen, Peter
Delhougne, Romain
Rooyackers, Rita
Loo, Roger
Vandervorst, Wilfried
De Meyer, Christina
Claeys, Corneel #
Issue Date: 2005
Publisher: AIP
Host Document: pages:187-190
Conference: Noise and Fluctuations: 18th International Conference on Noise and Fluctuations - ICNF location:Leuven Belgium date:19/09/05
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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