|ITEM METADATA RECORD
|Title: ||Extraction of physical parameters of alternative high-k gate stacks through comparison between measurements and quantum simulations|
|Authors: ||Campera, A ×|
Groeseneken, Guido #
|Issue Date: ||Apr-2005 |
|Host Document: ||pages:35-38|
|Conference: ||6th European Conference on Ultimate Integration of Silicon - ULIS location:Pisa I date:07/04/05|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
× corresponding author|
# (joint) last author|
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