Title: Extraction of physical parameters of alternative high-k gate stacks through comparison between measurements and quantum simulations
Authors: Campera, A ×
Iannaccone, G
Crupi, F
Groeseneken, Guido #
Issue Date: Apr-2005
Host Document: pages:35-38
Conference: 6th European Conference on Ultimate Integration of Silicon - ULIS location:Pisa I date:07/04/05
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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