Title: Recovery behaviour resulting from thermal annealing in n-MOSFETs irradiated by 20MeV protons
Authors: Takakura, K ×
Ohyama, H
Ueda, A
Nakabayashi, M
Hayama, K
Kobayashi, K
Simoen, Eddy
Mercha, Abdelkarim
Claeys, Corneel #
Issue Date: 2003
Series Title: Semiconductor Science and Technology vol:18 issue:6 pages:506-511
ISSN: 0268-1242
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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