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Title: Noise as a diagnostic device tool for semiconductor material and device characterization
Authors: Claeys, Cor ×
Simoen, Eddy #
Issue Date: 1998
Series Title: Journal of the Electrochemical Society vol:145 issue:6 pages:2058-67
ISSN: 0013-4651
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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