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Title: Back gate voltage and buried-oxide thickness influences on the series resistance of fully depleted SOI MOSFETs at 77 K
Authors: Nicolett, A. S ×
Martino, Joao Antonio
Simoen, Eddy
Claeys, Cor #
Issue Date: 1998
Series Title: Journal de Physique IV vol:8 pages:3-25-28
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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