This item still needs to be validated !
Title: Explanation of the "long distance" Vt roll-off in deep submicron nMOS transistors with Indium channel
Authors: Kubicek, Stefan ×
Lyu, Jeong-Ho
De Meyer, Kristin #
Issue Date: 1998
Conference: Proceedings of the 28th European Solid-State Device Research Conference - ESSDERC'98; 8-10 Sept. 1998; Bordeaux, France. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.