Title: Modeling 1/f noise and extraction of the SPICE noise parameters using a new extraction procedure
Authors: Van Heijningen, Marc ×
Vandamme, Ewout
Deferm, Ludo
Vandamme, Lorenz #
Issue Date: 1998
Host Document: pages:468-71
Conference: Proceedings of the 28th European Solid-State Device Research Conference - ESSDERC'98; 8-10 Sept. 1998; Bordeaux, France. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.