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|ITEM METADATA RECORD
|Title: ||The impact of the Ge content on the characteristics of strained Si1-xGex epitaxial diodes before and after degradation by high energy particles|
|Authors: ||Ohyama, Hidenori ×|
Caymax, Matty #
|Issue Date: ||1998 |
|Host Document: ||pages:548-51|
|Conference: ||Proceedings of the 28th European Solid-State Device Research Conference - ESSDERC'98; 8-10 Sept. 1998; Bordeaux, France.|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author|
# (joint) last author|
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