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Title: The impact of the Ge content on the characteristics of strained Si1-xGex epitaxial diodes before and after degradation by high energy particles
Authors: Ohyama, Hidenori ×
Simoen, Eddy
Claeys, Cor
Takami, Y
Hayama, Kiyoteru
Hakata, T
Kobayashi, K
Sunaga, H
Poortmans, Jef
Caymax, Matty #
Issue Date: 1998
Host Document: pages:548-51
Conference: Proceedings of the 28th European Solid-State Device Research Conference - ESSDERC'98; 8-10 Sept. 1998; Bordeaux, France.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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