|ITEM METADATA RECORD
|Title: ||Active dopant characterization methodology for Germanium|
|Authors: ||Clarysse, Trudo|
|Issue Date: ||2005 |
|Host Document: ||Proceedings of the 8th Int. Workshop on the Fabrication , Characterization and Modeling of Ultra Shallow Junctions in Semicond pages:373-382|
|Conference: ||8th Int. Workshop on the Fabrication , Characterization and Modeling of Ultra Shallow Junctions in Semicond. location:Leuven Belgium date:05/06/05|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
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