Title: Processing aspects in the low-frequency noise of n-MOSFETs on strained silicon substrates
Authors: Simoen, Eddy ×
Eneman, Geert
Verheyen, Peter
Loo, Roger
De Meyer, Christina
Claeys, Corneel #
Issue Date: May-2006
Series Title: IEEE Transactions on Electron Devices vol:53 issue:5 pages:1039-1047
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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