ITEM METADATA RECORD
Title: Impact of hot-carrier stress on gate-induced floating body effects and drain current transients of thin-gate-oxide partially depleted SOI NMOSFETs
Authors: Rafi, J.M ×
Simoen, Eddy
Mercha, Abdelkarim
Canmpabadal, F
Claeys, Corneel #
Issue Date: 2005
Series Title: Solid-State Electronics vol:49 issue:5 pages:1536-1546
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.

© Web of science