|ITEM METADATA RECORD
|Title: ||Impact of hot-carrier stress on gate-induced floating body effects and drain current transients of thin-gate-oxide partially depleted SOI NMOSFETs|
|Authors: ||Rafi, J.M ×|
Claeys, Corneel #
|Issue Date: ||2005 |
|Series Title: ||Solid-State Electronics vol:49 issue:5 pages:1536-1546|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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