Title: Effect of high-temperature electron irradiation in thin gate oxide FD-SOI n-MOSFETs
Authors: Hayama, K ×
Takakura, K
Ohyama, H
Rafi, J.M
Mercha, Abdelkarim
Simoen, Eddy
Claeys, Corneel #
Issue Date: 2005
Series Title: IEEE Transactions on Nuclear Science vol:52 issue:6, Part 1 pages:2392-2397
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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