|ITEM METADATA RECORD
|Title: ||Radiation defects and degradation of C-doped SiGe diodes irradiated by electrons|
|Authors: ||Takakura, K|
|Issue Date: ||2005 |
|Conference: ||XIth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors - DRIP date:15/09/05|
|Publication status: ||published|
|KU Leuven publication type: ||IMa|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
|Files in This Item:
There are no files associated with this item.
All items in Lirias are protected by copyright, with all rights reserved.