Title: Radiation defects and degradation of C-doped SiGe diodes irradiated by electrons
Authors: Takakura, K
Furukawa, H
Kuroki, S
Hayama, H
Kudou, T
Shigaki, K
Ohyama, H
Simoen, Eddy
Eneman, Geert
Claeys, Corneel
Issue Date: 2005
Conference: XIth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors - DRIP date:15/09/05
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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