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Title: Impact of strain and strain-relaxation on the low-frequency noise of SRB silicon n-MOSFETs
Authors: Simoen, Eddy ×
Eneman, Geert
Claeys, Corneel
Verheyen, Peter
Delhougne, Romain
Loo, Roger
De Meyer, Christina #
Issue Date: 2005
Publisher: IEEE
Host Document: pages:529-532
Conference: Proceedings of the 35th European Solid-State Device Research Conference - ESSDERC location:Leuven Belgium date:13/09/05
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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