|ITEM METADATA RECORD
|Title: ||Gated-diode study of corner and peripheral leakage current in high-energy neutron irradiated silicon p-n junctions|
|Authors: ||Czerwinski, A ×|
Ohyama, H #
|Issue Date: ||2003 |
|Series Title: ||IEEE Transactions on Nuclear Science vol:50 issue:2 pages:278-287|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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