Title: Gated-diode study of corner and peripheral leakage current in high-energy neutron irradiated silicon p-n junctions
Authors: Czerwinski, A ×
Simoen, Eddy
Poyai, Amporn
Claeys, Corneel
Ohyama, H #
Issue Date: 2003
Series Title: IEEE Transactions on Nuclear Science vol:50 issue:2 pages:278-287
ISSN: 0018-9499
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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