Title: Behavior of hot hole stressed SiO2/Si interface at elevated temperatures
Authors: Zhang, Jenny ×
Al-kofahi, I. S
Groeseneken, Guido #
Issue Date: 1998
Series Title: J. Appl. Phys. vol:83 issue:2 pages:843-50
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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