Title: Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics
Authors: Kerber, Andreas ×
Cartier, Eduard
Pantisano, Luigi
Degraeve, Robin
Kauerauf, Thomas
Kim, Young-Chang
Hou, A
Groeseneken, Guido
Maes, Herman
Schwalke, U #
Issue Date: 2003
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:24 issue:2 pages:87-89
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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