Title: Model for the current-voltage characteristics of ultrathin gate oxides after soft breakdown
Authors: Houssa, Michel ×
Nigam, Tanya
Mertens, Paul
Heyns, Marc #
Issue Date: 1998
Publisher: American Institute of Physics
Series Title: Journal of Applied Physics vol:84 issue:8 pages:4351-5
ISSN: 0021-8979
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Semiconductor Physics Section
Clinical Residents Medicine
Surface and Interface Engineered Materials
× corresponding author
# (joint) last author

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