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Title: Back gate voltage influence on the LDD SOI NMOSFET series resistance extraction from 150 to 300 K
Authors: Nicolett, A. S
Martino, Joao Antonio
Simoen, Eddy
Claeys, Cor
Issue Date: 1998
Conference: NATO Advanced Research Workshop on "Perspectives, Sciences and Technologies of Novel Silicon-on-Insulator Devices"; 12-15 Octobe
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems

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